张秀兰, 栗印环, 余国忠. X射线粉末衍射法分析石墨插层化合物的结构[J]. 信阳师范学院学报(自然科学版), 2004, 17(2): 183-185.
引用本文: 张秀兰, 栗印环, 余国忠. X射线粉末衍射法分析石墨插层化合物的结构[J]. 信阳师范学院学报(自然科学版), 2004, 17(2): 183-185.
ZHANG Xiu-lan, LI Yin-huan, YU Guo-zhong. Analysis of graphite intercalation compounds by X-ray diffraction[J]. Journal of Xinyang Normal University (Natural Science Edition), 2004, 17(2): 183-185.
Citation: ZHANG Xiu-lan, LI Yin-huan, YU Guo-zhong. Analysis of graphite intercalation compounds by X-ray diffraction[J]. Journal of Xinyang Normal University (Natural Science Edition), 2004, 17(2): 183-185.

X射线粉末衍射法分析石墨插层化合物的结构

Analysis of graphite intercalation compounds by X-ray diffraction

  • 摘要: 根据X射线粉末衍射谱图,对经不同方式处理的石墨的结构进行分析,用对比方法比较了它们衍射谱图中衍射峰位置和强度的差异,分析其原因,进而判断它们的结构特征.结果表明可以利用适当的方法使一些非碳反应物插入石墨层间,从而制成石墨层间化合物(GIC),改善其性能,扩大其应用领域.

     

    Abstract: According to X-ray power diffraction,the patterns of graphite which was treated by different methods are obtained.These X-ray diffraction patterns show that the layers of graphite are inserted by other matters by physical and chemical methods.This kind of matter is called graphite complex intercalation compound which widen the application of the graphite complex intercalation compound.

     

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