CMOS OTA电路的统计优化设计
Statistical optimization on CMOS OTA
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摘要: 考察了ＣＭＯＳ 集成电路统计最优化问题的特殊性．用统计方法估计电路成品率，并结合ＣＭＯＳ 制造工艺的统计特性对ＯＴＡ 单元电路进行成品率优化设计．Abstract: The specialities of statistical optimal problem on CMOS IC is considered.The parametric yield is estimated by the statistical method.The yield optimization for CMOS OTA cell circuits is realized.
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