低温碳纳米管的XPS光谱特征研究
XPS Study on Surface of Low-temperature Prepared Carbon Nanotubes by Post-treatment
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摘要: 采用X射线光电子能谱对后处理前后的低温碳管(LT-CNTs)进行表面特征分析.发现纯化后碳管的O/C原子比升高,经过Ar气保护下的高温煅烧的后处理后,其O/C原子比降低,比表面积增大.对C1 s峰的拟合分析表明,碳管表面的含氧基团发生改变,深度纯化碳管时,大量活性碳原子变为羟基(C-O),大量的羰基(C=O)变为羧基(O-C=O).同时,大部分化学吸附的氧气将解吸,氧气的解吸将使C-O键或O-C=O转变为C=O双键等形式,且伴随碳管电学性质的改变,由明显的金属性转变为半导体性.Abstract: X-ray photoelectron spectroscopy(XPS) was used to investigate the surface characteristics of the low-temperature prepared carbon nanotubes after post-treatment.The results indicated that the O/C ratio was increased through purification and decreased by annealing in the protection of Ar gas.Through C1s curve-fitting of low-temperature carbon nanotubes,it was found that the oxygenous groups of surface carbon nanotubes was changed by purification and annealing.The part of oxygen atoms was desorbed from the sur...