光伏组件失效之蜗牛纹分析

Failure Analysis of the Snail Trail for Photovoltaic Modules

  • 摘要: 为了探究光伏组件在户外运行过程中产生蜗牛纹缺陷的机理,系统分析了失效组件的电性能衰减变化、蜗牛纹的微观形貌、银栅线和EVA胶膜的成分变化.结果表明,户外湿热环境以及组件制备工艺是造成蜗牛纹产生的主要原因.改善组件工艺和因地制宜地选择不同技术组件能够有效避免蜗牛纹.

     

    Abstract: In order to investigate the mechanism of snail trail defects of photovoltaic modules during outdoor exposed process, a comprehensive analysis was carried out including the degradation of electrical properties, the SEM of the snail trail, the element of Ag finger and EVA encapsulant with snail strail. As a result, the climate of hot-humid and technology of photovoltic modules are the main causes of snail trail. It will be effective to avoid snail trail by improving the technology of PV modules and choosing PV modules depending on adaptation to local conditions.

     

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