Abstract: According to the visual measurement problems of surface mount device (SMD) on Chip Mounter, the image recognition and measurement algorithms about SMD were investigated. The SMD image was acquired by the vision on-the-fly technology. The Gauss filter algorithm, iterative algorithm and minimum area circumscribed rectangle algorithm for image recognition and measurement of SMD were presented based on its geometrical characteristic. The corresponding comparison analysis and verification have been implemented based on the Halcon and OpenCV machine vision platform.